Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/01/2008
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Application #:
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11037105
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Filing Dt:
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01/19/2005
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Publication #:
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Pub Dt:
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09/29/2005
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Inventors:
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Hidefumi Ibe, Yasuo Yahagi, Hideaki Kameyama
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Title:
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METHOD FOR EVALUATING SEMICONDUCTOR DEVICE ERROR AND SYSTEM FOR SUPPORTING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| MATTINGLY, STANGER, MALUR & BRUNDIDGE |
| 1800 DIAGONAL RD. |
| SUITE 370 |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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MERGER AND CHANGE OF NAME
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| 1753, SHIMONUMABE, NAKAHARA-KU |
| KAWASAKI-SHI |
| KANAGAWA, JAPAN 211-8668 |
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| MATTINGLY & MALUR, P.C. |
| 1800 DIAGONAL RD. |
| SUITE 370 |
| ALEXANDRIA, VA 22314 |
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