Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/19/2009
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Application #:
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10892696
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Filing Dt:
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07/15/2004
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Publication #:
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Pub Dt:
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09/29/2005
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Inventor:
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Mohamed Azimane
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Title:
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METHOD FOR DETECTING RESISTIVE-OPEN DEFECTS IN SEMICONDUCTOR MEMORIES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| HIGH TECH CAMPUS 60 |
| 5656 AG EINDHOVEN, NETHERLANDS |
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| ELIZABETH PARSONS |
| 1825 EYE STREET, NW |
| WASHINGTON, DC 20006 |
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