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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/17/2006
Application #:
10850460
Filing Dt:
05/21/2004
Publication #:
Pub Dt:
11/24/2005
Inventors:
Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shun-Miin Wang
Title:
SMART CAPTURE FOR ATPG (AUTOMATIC TEST PATTERN GENERATION) AND FAULT SIMULATION OF SCAN-BASED INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
015799/0651Recorded: 09/17/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/31/2004
Exec Dt:
08/27/2004
Exec Dt:
08/17/2004
Exec Dt:
08/27/2004
Exec Dt:
08/27/2004
Assignee:
505 S. PASTORIA AVENUE
SUITE 101
SUNNYVALE, CALIFORNIA 94086
Correspondent:
JIM ZEGEER
801 N. PITT STREET
SUITE 108
ALEXANDRIA, VA 22314

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