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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10908489
Filing Dt:
05/13/2005
Publication #:
Pub Dt:
12/08/2005
Inventors:
Takeshi Ikeda, Hiroshi Miyagi
Title:
SEMICONDUCTOR INSPECTION APPARATUS AND TRAY FOR INSPECTION PARTS USED THEREOF
Assignment: 1
Reel/Frame:
016013/0017Recorded: 05/13/2005Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/20/2004
Exec Dt:
12/20/2004
Assignee:
5-13 NISHISHIROCHO 2-CHOME
JYOETSU-SHI, JAPAN 943-0834
Correspondent:
CONNOLLY BOVE LODGE & HUTZ LLP
SUITE 800
1990 M STREET NW
WASHINGTON, DC 20036-3425

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