Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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11096137
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Filing Dt:
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03/31/2005
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Publication #:
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Pub Dt:
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12/15/2005
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Inventor:
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Young-Sik Kim
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Title:
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LARGE SCALE INTEGRATED CIRCUIT AND AT SPEED TEST METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI |
| GYEONGGI-DO, KOREA, REPUBLIC OF |
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| FRANK CHAU & ASSOCIATES, LLC |
| FRANK CHAU, ESQ. |
| 130 WOODBURY ROAD |
| WOODBURY, NY 11797 |
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