Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11185967
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Filing Dt:
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07/21/2005
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Publication #:
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Pub Dt:
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02/09/2006
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Inventor:
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Stephan von Appen
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Title:
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Process and a device for the calibration of a semiconductor component test system
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ST.-MARTIN-STR. 53 |
| MUNCHEN, GERMANY 81669 |
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| MORRISON & FOERSTER LLP |
| KEVIN R. SPIVAK |
| 1650 TYSONS BLVD, SUITE 300 |
| MCLEAN, VA 22102 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR NAME PREVIOUSLY RECORDED ON REEL 017060 FRAME 0790. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNOR'S INTEREST (SEE DOCUMENT FOR DETAILS).
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| ST.-MARTIN-STR. 53 |
| MUENCHEN, GERMANY 81669 |
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| IRA S. MATSIL |
| 17950 PRESTON ROAD, SUITE 1000 |
| DALLAS, TX 75252 |
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