Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
10940369
|
Filing Dt:
|
09/14/2004
|
|
Publication #:
|
|
Pub Dt:
|
03/16/2006
| | | | |
|
Inventors:
|
Richard J. Markle, Kevin R. Lensing, Christopher A. Bode
|
|
Title:
|
Method and system for calibrating integrated metrology systems and stand-alone metrology systems that acquire wafer state data
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 5204 E. BEN WHITE BLVD. |
| AUSTIN, TEXAS 78741 |
|
|
|
|
| WILLIAMS, MORGAN & AMERSON, P.C. |
| J. MIKE AMERSON |
| 10333 RICHMOND, SUITE 1100 |
| HOUSTON, TEXAS 77042 |
|
|
Search Results as of:
05/22/2024 10:28 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
