Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11034349
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Filing Dt:
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01/11/2005
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Publication #:
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Pub Dt:
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03/23/2006
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Inventors:
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Yuping Gu, Manoocher Birang, Arulkumar Shanmugasundram, Dmitry Lubomirsky et al
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Title:
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Patterned wafer thickness detection system
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3050 BOWERS AVENUE |
| SANTA CLARA, CALIFORNIA 95054 |
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| ROBERT W. MULCAHY |
| APPLIED MATERIALS, INC. |
| P.O. BOX 1450 |
| SANTA CLARA, CA 95052 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 450-A |
| PATENT COUNSEL |
| SANTA CLARA, CALIFORNIA 95052 |
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| APPLIED MATERIALS, INC. |
| P.O. BOX 450-A |
| PATENT COUNSEL |
| SANTA CLARA, CA 95052 |
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