Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/21/2007
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Application #:
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11259191
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Filing Dt:
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10/26/2005
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Publication #:
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Pub Dt:
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04/27/2006
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Inventors:
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Asao Nakano, Takao Kinefuchi, Hiroshi Motono, Atsunori Kiku
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Title:
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X-RAY THIN FILM INSPECTION APPARATUS AND THIN FILM INSPECTION APPARATUS AND METHOD FOR PATTERNED WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-9-12, MATSUBARA-CHO |
| AKISHIMA-SHI, TOKYO, 196-8666, JAPAN |
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| C. BRUCE HAMBURG, ESQ. |
| JORDAN AND HAMBURG LLP |
| CHANIN BUILDING, SUITE 4000 |
| 122 EAST 42ND STREET |
| NEW YORK, NEW YORK 10168 |
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