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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/08/2008
Application #:
11303191
Filing Dt:
12/16/2005
Publication #:
Pub Dt:
05/04/2006
Inventors:
Kazuhiko Sato, Sae-Bum Myung, Hiroyuki Chiba
Title:
SEMICONDUCTOR TEST APPARATUS AND CONTROL METHOD THEREFOR
Assignment: 1
Reel/Frame:
017382/0117Recorded: 12/16/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/22/2005
Exec Dt:
11/22/2005
Exec Dt:
11/22/2005
Assignee:
1-32-1, ASAHI-CHO, NERIMA-KU
TOKYO 179-0071, JAPAN
Correspondent:
JONATHAN P. OSHA
OSHA - LIANG LLP
1221 MCKINNEY ST., SUITE 2800
HOUSTON, TX 77010

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