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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/23/2007
Application #:
10498695
Filing Dt:
07/29/2004
Publication #:
Pub Dt:
05/25/2006
Inventors:
Qing Wei Zhou, Jun Fujiwara, Koji Yamabe, Ayumu Inoue
Title:
COPPER FOIL INSPECTION DEVICE COPPER FOIL INSPECTION METHOD DEFECT INSPECTION DEVICE AND DEFEAT INSPECTION METHOD
Assignment: 1
Reel/Frame:
015649/0843Recorded: 08/05/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/04/2004
Exec Dt:
06/04/2004
Exec Dt:
06/08/2004
Exec Dt:
06/08/2004
Assignees:
2-3-9, AMANUMA SUGINAMI-KU
TOKYO 1678-0032, JAPAN
1-11-1, OSAKI, SHINAGAWA-KU
TOKYO 141-8584, JAPAN
Correspondent:
MCCRACKEN & FRANK
J. WILLIAM FRANK III
200 W. ADAMS, SUITE 2150
CHICAGO, IL 60606
Assignment: 2
Reel/Frame:
016326/0183Recorded: 06/13/2005Pages: 3
Conveyance:
TO CORRECT ASSIGNOR AND ASSIGNEE AT REEL/FRAME 015649/0843
Assignors:
Exec Dt:
06/04/2004
Exec Dt:
06/04/2004
Exec Dt:
06/08/2004
Exec Dt:
06/08/2004
Assignees:
2-3-9, AMANUMA, SUGINAMI-KU
TOKYO 1678-0032, JAPAN
1-11-1, OSAKI, SHINAGAW-KU
TOKYO 141-8584, JAPAN
Correspondent:
J. WILLIAM FRANK III, ESQ.
MCCRACKEN & FRANK
200 W. ADAMS
SUITE 2150
CHICAGO, IL 60606

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