Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/25/2008
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Application #:
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11235458
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Filing Dt:
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09/26/2005
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Publication #:
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Pub Dt:
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06/01/2006
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Inventors:
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Masatsugu Shigeno, Yoshiharu Shirakawabe, Amiko Nihei, Naoya Watanabe, Akira Inoue et al
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Title:
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SCANNING PROBE MICROSCOPE AND SCANNING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI |
| CHIBA, JAPAN 261-8507 |
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| BRUCE L. ADAMS |
| ADAMS & WILKS |
| 17 BATTERY PLACE - SUITE 1231 |
| NEW YORK, NEW YORK 10004 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI-SHIMBASHI, 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| BRUCE L. ADAMS, ESQ. |
| ADAMS & WILKS |
| 17 BATTERY PLACE |
| SUITE 1343 |
| NEW YORK, NY 10004 |
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