Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/01/2009
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Application #:
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11192199
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Filing Dt:
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07/27/2005
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Publication #:
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Pub Dt:
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06/29/2006
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Inventors:
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Zhi Cheng Jiang, Shan Dan Li, Yuen Kwan Kam, Yi Wei Liu
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Title:
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METHOD OF NANO THIN FILM THICKNESS MEASUREMENT BY AUGER ELECTRON SPECTROSCOPY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAE TECHNOLOGY CENTRE, 6 SCIENCE PARK EAST AVENUE |
| HONG KONG SCIENCE PARK |
| SHATIN, N.T., HONG KONG |
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| STEPHEN T. NEAL, ESQ. |
| KENYON & KENYON |
| 333 W. SAN CARLOS STREET, SUITE 600 |
| SAN JOSE, CA 95110-2711 |
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