Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11293031
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Filing Dt:
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12/02/2005
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Publication #:
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Pub Dt:
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06/29/2006
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Inventors:
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Susanne Lachenmann, Valentin Rosskopf, Sibina Sukman-Praehofer, Ramona Winter
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Title:
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Semiconductor wafer with a test structure, and method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ST.-MARTIN-STRASSE 53 |
| MUENCHEN, GERMANY 81669 |
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| SLATER & MATSIL, L.L.P. |
| 17950 PRESTON RD. |
| SUITE 1000 |
| DALLAS, TX 75252 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| GUSTAV-HEINEMANN-RING 212 |
| MUNICH, GERMANY 81739 |
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| JONATHAN BOCKMAN |
| C/O MORRISON & FOERSTER LLP |
| 1650 TYSONS BOULEVARD SUITE 400 |
| MCLEAN, VA 22102 |
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