Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/22/2008
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Application #:
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11317286
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Filing Dt:
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12/27/2005
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Publication #:
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Pub Dt:
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08/24/2006
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Inventors:
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Noriyasu Iwane, Yuichi Watanabe, Takezo Sugimura, Toshiyuki Satoh, Atsushi Kimura et al
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Title:
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METHOD FOR DETERMINING DETERIORATION OF ACCUMULATOR BATTERY, METHOD FOR MEASURING INTERNAL IMPEDANCE OF SECONDARY BATTERY, EQUIPMENT FOR MEASURING INTERNAL IMPEDANCE OF SECONDARY BATTERY, EQUIPMENT FOR DETERMINING DETERIORATION OF SECONDARY BATTERY, AND POWER SUPPL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-6-1, MARUNOUCHI, CHIYODA-KU |
| TOKYO 100-8322, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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