Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10565177
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Filing Dt:
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01/19/2006
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Publication #:
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Pub Dt:
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08/31/2006
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Inventor:
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Naoki Ando
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Title:
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Test method, semiconductor device, and display
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-35, KITASHINAGAWA 6-CHOME |
| TOKYO, JAPAN 141-0001 |
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| LERNER, DAVID, LITTENBERG, |
| KRUMHOLZ & MENTLIK |
| 600 SOUTH AVENUE WEST |
| WESTFIELD, NJ 07090 |
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Assignment:
2
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RE-RECORD TO CORRECT THE ADDRESS OF THE ASSIGNEE, PREVIOUSLY RECORDED ON REEL 017247 FRAME 0169.
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| 7-35, KITASHINAGAWA 6-CHOME |
| SHINAGAWA-KU, TOKYO 141-0001, JAPAN |
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| ROBERT B. COHEN |
| LERNER, DAVID, LITTENBERG, ET AL |
| 600 SOUTH AVENUE WEST |
| WESTFIELD, NEW JERSEY 07090 |
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