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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	7379716	Issue Dt:	05/27/2008	Application #:	11088933	Filing Dt:	03/24/2005
Publication #:	20060217085	Pub Dt:	09/28/2006
Inventors:	William R. Eisenstadt, Robert M. Fox, Jang Sup Yoon, Tao Zhang
Title:	EMBEDDED IC TEST CIRCUITS AND METHODS

Assignment: 1

Reel/Frame:

016186/0480

Recorded: 06/27/2005

Pages: 8

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

EISENSTADT, WILLIAM R.

Exec Dt:

03/22/2005

FOX, ROBERT M.

Exec Dt:

03/23/2005

YOON, YANG SUP

Exec Dt:

03/23/2005

ZHANG, TAO

Exec Dt:

03/23/2005

Assignee:

UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.

223 GRINTER HALL

GAINESVILLE, FLORIDA 32611

Correspondent:

RICHARD A. HINSON

P.O. BOX 3188

WEST PALM BEACH, FL 33402-3188

Assignment: 2

Reel/Frame:

016287/0571

Recorded: 07/20/2005

Pages: 8

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE THIRD ASSIGNOR'S NAME PREVIOUSLY RECORDED ON REEL 016186 FRAME 0480. ASSIGNOR(S) HEREBY CONFIRMS THE FROM "YOON, YANG SUP" TO --YOON, JANG SUP--.

Assignors:

EISENSTADT, WILLIAM R.

Exec Dt:

03/22/2005