Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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09/16/2008
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Application #:
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11283839
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Filing Dt:
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11/22/2005
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Publication #:
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Pub Dt:
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10/05/2006
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Inventor:
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Hiroshi Kawamata
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Title:
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TAG TESTING DEVICE, TAG TESTING METHOD, AND TAG TESTING PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, KAMIKODANAKA 4-CHOME |
NAKAHARA-KU, KAWASAKI-SHI |
KANAGAWA 211-8588, JAPAN |
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STAAS & HALSEY LLP |
ATTENTION: MEHDI D. SHEIKERZ |
1201 NEW YORK AVE., NW, SUITE 700 |
WASHINGTON, D.C. 20005Y |
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Assignment:
2
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RECORD TO ADD THE NAME AND ADDRESS OF THE SECOND ASSIGNEE ON THE ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED AT REEL 017274 FRAME 0652. THE CORRECT NAME AND ADDRESS OF THE SECOND ASSIGNEEIS FUJITSU FRONTECH LIMTED 1778, YANOKUCHI INAGI-SHI, TOKYO 206-8555
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1-1, KAMIKODANAKA 4-CHOME |
NAKAHARA-KU, KAWASAKI-SHI |
KANAGAWA 211-8588, JAPAN |
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1776, YANOKUCHI, INAGI-SHI |
TOKYO 206-8588, JAPAN |
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STAAS & HALSEY LLP |
ATTENTION: MEHDI D. SHEIKERZ |
1201 NEW YORK AVE., N.W. |
7TH FLOOR |
WASHINGTON, DC 20005 |
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Assignment:
3
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CORRECTIVE ASSIGNMENT TO CORRECTTHE SECOND ASSIGNEE'S NAME PREVIOUSLY RECORDED ON REEL 017647, FRAME 0103
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1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU |
KAWASAKI KANAGAWA 211-8588, JAPAN |
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1776, YANOKUCHI, INAGI-SHI |
TOKYO 206-8555, JAPAN |
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STAAS & HALSEY LLP |
ATTN: MEHDI D. SHEIKERZ |
1201 NEW YORK AVENUE, N.W., 7TH FLOOR |
WASHINGTON, D.C. 20005 |
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