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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7462828
Issue Dt:
12/09/2008
Application #:
11412976
Filing Dt:
04/28/2006
Publication #:
20060243906
Pub Dt:
11/02/2006
Inventors:
Atsuko Fukada, Mitsugu Sato, Naomasa Suzuki, Hidetoshi Nishiyama, Muneyuki Fukuda et al
Title:
INSPECTION METHOD AND INSPECTION SYSTEM USING CHARGED PARTICLE BEAM
Assignment: 1
Reel/Frame:
017841/0410Recorded: 04/28/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
FUKADA, ATSUKO
Exec Dt:
03/30/2006
SATO, MITSUGU
Exec Dt:
03/30/2006
SUZUKI, NAOMASA
Exec Dt:
03/30/2006
NISHIYAMA, HIDETOSHI
Exec Dt:
04/07/2006
FUKUDA, MUNEYUKI
Exec Dt:
03/31/2006
TAKAHASHI, NORITSUGU
Exec Dt:
03/30/2006
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
600 13TH STREET, N.W.
WASHINGTON, DC 20005-3096
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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