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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/15/2008
Application #:
11492933
Filing Dt:
07/26/2006
Publication #:
Pub Dt:
11/23/2006
Inventors:
Toshihisa Tanaka, Atsushi Tanaka, Takeshi Soma
Title:
POLISHING PAD SURFACE SHAPE MEASURING INSTRUMENT, METHOD OF USING POLISHING PAD SURFACE SHAPE MEASURING INSTRUMENT, METHOD OF MEASURING APEX ANGLE OF CONE OF POLISHING PAD, METHOD OF MEASURING DEPTH OF GROOVE OF POLISHING PAD, CMP POLISHER, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
018136/0342Recorded: 07/26/2006Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/29/2006
Exec Dt:
07/04/2006
Exec Dt:
07/04/2006
Assignees:
2-3, MARUNOUCHI 3-CHOME, CHIYODA-KU
TOKYO, JAPAN
11-1, HANEDA-ASAHI-CHO, OHTA-KU
TOKYO, JAPAN
Correspondent:
ROBERT J. GAYBRICK
MORGAN, LEWIS & BOCKIUS LLP
1111 PENNSYLVANIA AVENUE, N.W.
WASHINGTON, DC 20004
Assignment: 2
Reel/Frame:
021478/0804Recorded: 09/05/2008Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/01/2008
Assignee:
2-3, MARUNOUCHI 3-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ROBERT J. GAYBRICK
1111 PENNSYLVANIA AVENUE, NW
MORGAN, LEWIS & BOCKIUS LLP
WASHINGTON, DC 20004

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