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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11439538
Filing Dt:
05/24/2006
Publication #:
Pub Dt:
12/21/2006
Inventors:
Fumihiko Fukunaga, Kouichi Hayakawa, Masayoshi Takeda
Title:
Focus correction method for inspection of circuit patterns
Assignment: 1
Reel/Frame:
018179/0787Recorded: 08/14/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Assignee:
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
600 13TH STREET, N.W.
WASHINGTON, D.C. 20005-3096

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