Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10565034
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Filing Dt:
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06/08/2006
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Publication #:
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Pub Dt:
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12/28/2006
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Inventors:
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Jean-Luc Rouviere, Laurent Clement, Roland Pantel
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Title:
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METHOD FOR MEASURING PHYSICAL PARAMETERS OF AT LEAST ONE MICROMETRIC OR NANOMETRIC DIMENSIONAL PHASE IN A COMPOSITE SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 31-33 RUE DE LA FEDERATION |
| PARIS, FRANCE 75015 |
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| RAYMOND O. LINKER, JR. |
| 101 S. TRYON STREET, SUITE 4000 |
| CHARLOTTE, NC 28280 |
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