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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
NONE
Issue Dt:
Application #:
11475792
Filing Dt:
06/26/2006
Publication #:
Pub Dt:
01/04/2007
Inventor:
Andrzej Buczkowski
Title:
Apparatuses and methods for detecting defects in semiconductor workpieces
Assignment: 1
Reel/Frame:
018046/0850Recorded: 06/26/2006Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/26/2006
Assignee:
1320 SE ARMOUR DRIVE
SUITE B2
BEND, OREGON 97702
Correspondent:
DAVID T. DUTCHER
PERKINS COIE LLP
P.O. BOX 1247
SEATTLE, WA 98111-1247
Assignment: 2
Reel/Frame:
019469/0299Recorded: 06/22/2007Pages: 8
Conveyance:
MERGER (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/21/2006
Exec Dt:
07/21/2006
Assignee:
1550 BUCKEY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
MICHAEL J. HALBERT
18805 COX AVENUE, SUITE 220
SARATOGA, CA 95070
Assignment: 3
Reel/Frame:
019543/0863Recorded: 07/11/2007Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/18/2007
Assignee:
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035-7418
Correspondent:
MICHAEL J. HALBERT
18805 COX AVENUE, SUITE 220
SARATOGA, CA 95070

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