Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/06/2010
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Application #:
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11409273
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Filing Dt:
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04/24/2006
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Publication #:
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Pub Dt:
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01/11/2007
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Inventors:
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Masahiro Takeda, Kazuhiro Hotta
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Title:
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SEMICONDUCTOR FAILURE ANALYSIS APPARATUS, FAILURE ANALYSIS METHOD, FAILURE ANALYSIS PROGRAM, AND FAILURE ANALYSIS SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1126-1, ICHINO-CHO, HAMAMATSU-SHI |
| SHIZUOKA 435-8558, JAPAN |
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| PETER J SISTARE |
| DRINKER BIDDLE & REATH LLP |
| 1500 K. STREET, N.W., SUITE 1100 |
| WASHINGTON, D.C. 20005-1209 |
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