Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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05/20/2008
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Application #:
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11536915
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Filing Dt:
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09/29/2006
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Publication #:
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Pub Dt:
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02/08/2007
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Inventor:
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Gaku Kamitani
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Title:
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METHOD AND APPARATUS FOR MEASURING HIGH-FREQUENCY ELECTRICAL CHARACTERISTICS OF ELECTRONIC DEVICE, AND METHOD FOR CALIBRATING APPARATUS FOR MEASURING HIGH-FREQUENCY ELECTRICAL CHARACTERISTICS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10-1, HIGASHIKOTARI 1-CHOME, NAGAOKAKYO-SHI |
| KYOTO-FU, JAPAN 602-8555 |
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| OSTROLENK, FABER, GERB & SOFFEN LLP |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10-1, HIGASHIKOTARI 1-CHOME |
| NAGAOKAKYO-SHI, KYOTO-FU 617-8555, JAPAN |
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| OSTROLENK FABER GERB, ET AL. |
| 1180 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036-8403 |
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