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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11504015
Filing Dt:
08/15/2006
Publication #:
Pub Dt:
02/22/2007
Inventors:
Hiroshi Ito, Shingo Ichimura, Toshiyuki Fujimoto, Hidehiko Nonaka
Title:
Standard specimen for probe shape evaluation and method for evaluating probe shape
Assignment: 1
Reel/Frame:
018202/0701Recorded: 08/15/2006Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/10/2006
Exec Dt:
08/10/2006
Exec Dt:
08/10/2006
Exec Dt:
08/10/2006
Assignee:
31-, KASUMIGASEKI 1-CHOME
CHIYODA-KU, TOKYO 100-8921, JAPAN
Correspondent:
MORGAN LEWIS & BOCKIUS LLP
1111 PENNSYLVANIA AVENUE NW
WASHINGTON, DC 20004

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