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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/23/2010
Application #:
11365492
Filing Dt:
03/02/2006
Publication #:
Pub Dt:
03/01/2007
Inventors:
Kengo Imagawa, Masami Makuuchi, Ritsuro Orihashi, Yoshiharu Ikeda, Koichiro Eguchi
Title:
SEMICONDUCTOR DEVICE, TESTING AND MANUFACTURING METHODS THEREOF
Assignment: 1
Reel/Frame:
017770/0736Recorded: 04/07/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/07/2006
Exec Dt:
03/09/2006
Exec Dt:
03/07/2006
Exec Dt:
03/21/2006
Exec Dt:
03/15/2006
Assignee:
4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY & STOUT & KRAUS, LLP
1300 NORTH 17TH STREET
SUITE 1800
ARLINGTON, VA 22209
Assignment: 2
Reel/Frame:
024964/0180Recorded: 09/09/2010Pages: 11
Conveyance:
MERGER AND CHANGE OF NAME
Assignor:
Exec Dt:
04/13/2010
Assignee:
1753, SHIMONUMABE
NAKAHARA-KU, KAWASAKI-SHI
KANAGAWA 211-8668, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET - SUITE 1800
ARLINGTON, VA 22209

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