Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/15/2010
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Application #:
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10564972
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Filing Dt:
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08/01/2006
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Publication #:
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Pub Dt:
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03/22/2007
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Inventors:
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Eitan Zait, Vladimir Dmitriev, Nikolay N. Guletsky, Sergey Oshemkov, Guy Ben-Zvi
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Title:
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METHOD FOR CORRECTING CRITICAL DIMENSION VARIATIONS IN PHOTOMASKS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O.BOX 351 |
| KARMIEL, ISRAEL 21613 |
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| PEARL COHEN ZEDEK LATZER, LLP |
| 1500 BROADWAY |
| 12TH FLOOR |
| NEW YORK, NY 10036 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 351 |
| KARMIEL, ISRAEL 21613 |
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| MOREY B. WILDES |
| 1500 BROADWAY |
| 12TH FLOOR |
| NEW YORK, NY 10036 |
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