Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/30/2008
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Application #:
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11249175
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Filing Dt:
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10/12/2005
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Publication #:
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Pub Dt:
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04/12/2007
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Inventors:
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Alain Charles Diebold, James Martin Price
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Title:
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METHODS FOR CHARACTERIZING SEMICONDUCTOR MATERIAL USING OPTICAL METROLOGY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2706 MONTOPOLIS DRIVE |
AUSTIN, TEXAS 78741-6499 |
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DAVID D. BAHLER |
FULBRIGHT & JAWORSKI L.L.P. |
600 CONGRESS AVENUE, SUITE 2400 |
AUSTIN, TX 78701 |
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