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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/31/2010
Application #:
11407549
Filing Dt:
04/19/2006
Publication #:
Pub Dt:
05/10/2007
Inventors:
Kirk Kohnen, Peter J. Sedivec, Douglas Bender, Gregory S. Becker, John Y. Liu et al
Title:
MULTIPLE FANNED LASER BEAM METROLOGY SYSTEM
Assignment: 1
Reel/Frame:
017684/0064Recorded: 05/26/2006Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/12/2006
Exec Dt:
04/12/2006
Exec Dt:
04/12/2006
Exec Dt:
04/12/2006
Exec Dt:
04/11/2006
Exec Dt:
04/17/2006
Exec Dt:
04/12/2006
Exec Dt:
04/14/2006
Exec Dt:
04/10/2006
Assignee:
100 N. RIVERSIDE
CHICAGO, ILLINOIS 60606-1596
Correspondent:
MACPHERSON KWOK CHEN & HEID LLP
2402 MICHELSON DRIVE
STE. 210
IRVINE, CA 92612

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