Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/09/2008
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Application #:
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11548531
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Filing Dt:
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10/11/2006
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Publication #:
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Pub Dt:
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05/17/2007
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Inventor:
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Fahrettin Levent DEGERTEKIN
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Title:
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OVERLAY MEASUREMENT METHODS WITH FIRAT BASED PROBE MICROSCOPE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 505 10TH STREET, N.W. |
| ATLANTA, GEORGIA 30332 |
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| MIN, HSIEH & HACK LLP |
| 8270 GREENSBORO DRIVE |
| SUITE 630 |
| MCLEAN, VA 22102 |
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