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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7730374
Issue Dt:
06/01/2010
Application #:
11555524
Filing Dt:
11/01/2006
Publication #:
20070118784
Pub Dt:
05/24/2007
Inventors:
Massahiro Fusumada, Hitoshi Saitoh, Shinji Togashi, Akira Yano
Title:
SELF TEST CIRCUIT FOR A SEMICONDUCTOR INTERGRATED CIRCUIT
Assignment: 1
Reel/Frame:
018838/0471Recorded: 02/01/2007Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
FUSUMADA, MASASHIRO
Exec Dt:
11/15/2006
SAITOH, HITOSHI
Exec Dt:
11/15/2006
TOGASHI, SHINJI
Exec Dt:
11/15/2006
YANO, AKIRA
Exec Dt:
11/15/2006
Assignee:
TEXAS INSTRUMENTS JAPAN, LTD
24-1 NISHI-SHINJUKU 6-CHOME
SHINJUKU-KU, TOKYO, JAPAN
Correspondent:
WILLIAM B KEMPLER
7839 CHURHILL WAY
MS 3999
DALLAS, TX 75251
Assignment: 2
Reel/Frame:
023787/0107Recorded: 01/14/2010Pages: 10
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME, PREVIOUSLY RECORDED ON REEL 018838 FRAME 0471. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE.
Assignors:
FUSUMADA, MASAHIRO
Exec Dt:
10/09/2009
SAITOH, HITOSHI
Exec Dt:
10/09/2009
TOGASHI, SHINJI
Exec Dt:
10/09/2009
YANO, AKIRA
Exec Dt:
10/09/2009
Assignee:
TEXAS INSTRUMENTS INCORPORATED
7839 CHURCHILL WAY, M/S 3999
DALLAS, TEXAS 75251
Correspondent:
WILLIAM B. KEMPLER
7839 CHURCHILL WAY, M/S 3999
DALLAS, TEXAS 75251

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