Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11542375
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Filing Dt:
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10/04/2006
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Publication #:
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Pub Dt:
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06/07/2007
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Inventor:
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Kazunori Koshikawa
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Title:
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Defect inspection method, defect inspection system, defect inspection program, and memory medium with that program memorized in it
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-11-22, HIGASHI-KAIGAN-MINAMI, CHIGASAKI-CITY |
| KANAGAWA, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER & NEUSTADT |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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