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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7673203
Issue Dt:
03/02/2010
Application #:
11616471
Filing Dt:
12/27/2006
Publication #:
20070157058
Pub Dt:
07/05/2007
Inventors:
Chang Won Park, Ki Man Jeon, Young Hwan Kim, Jae Gi Son, Hyun Bean Yi, Sung Ju Park
Title:
INTERCONNECT DELAY FAULT TEST CONTROLLER AND TEST APPARATUS USING THE SAME
Assignment: 1
Reel/Frame:
018682/0386Recorded: 12/27/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
PARK, CHANG WON
Exec Dt:
12/18/2006
JEON, KI MAN
Exec Dt:
12/18/2006
KIM, YOUNG HWAN
Exec Dt:
12/18/2006
SON, JAE GI
Exec Dt:
12/18/2006
YI, HYUN BEAN
Exec Dt:
12/18/2006
PARK, SUNG JU
Exec Dt:
12/18/2006
Assignee:
KOREA ELECTRONICS TECHNOLOGY INSTITUTE
68 YATAP-DONG, BUNDANG-GU
SUNGNAM-SI, KYUNGGI-DO, KOREA, REPUBLIC OF 463-816
Correspondent:
SUNHEE LEE
2100 PENNSYLVANIA AVENUE, N.W.
SUITE 800
WASHINGTON, DC 20037
Assignment: 2
Reel/Frame:
032551/0669Recorded: 03/28/2014Pages: 6
Conveyance:
LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Exec Dt:
03/28/2014
Assignee:
INTELLECTUAL DISCOVERY CO., LTD.
10TH FLOOR, GOLDEN TOWER, 511, SAMSUNG-RO, GANGNAM-GU
SEOUL, KOREA, REPUBLIC OF 135-090
Correspondent:
LEXYOUME IP MEISTER, PLLC
5180 PARKSTONE DRIVE, SUITE 175
CHANTILLY, VA 20151

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