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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
11378644
Filing Dt:
03/20/2006
Publication #:
Pub Dt:
07/19/2007
Inventors:
Kenichi Matsumura, Yasuko Saito
Title:
Pattern inspection apparatus and method and workpiece tested thereby
Assignment: 1
Reel/Frame:
017700/0171Recorded: 03/20/2006Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/24/2006
Exec Dt:
02/24/2006
Assignee:
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU
KAWASAKI-SHI, KANAGAWA, JAPAN 212-8583
Correspondent:
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314
Assignment: 2
Reel/Frame:
019385/0760Recorded: 06/05/2007Pages: 3
Conveyance:
CORPORATE ADDRESS CHANGE
Assignor:
Exec Dt:
03/24/2007
Assignee:
8, SHINSUGITA-CHO, ISOGO-KU
YOKOHAMA-SHI, KANAGAWA, JAPAN 235-0032
Correspondent:
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314

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