Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10565509
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Filing Dt:
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02/15/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Inventors:
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Ken Murayama, Yokio Kenbou, Yuuichi Kunitomo, Takenori Hiroki, Yoshiyuki Nagano et al
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Title:
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Probe replacement method for scanning probe microscope
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 19-11, YUSHIMA 3-CHOME |
| BUNKYO-KU, TOKYO, JAPAN |
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| JOHN R. MATTINGLY |
| MATTINGLY STANGER MALUR & BRUNDIDGE, PC |
| 1800 DIAGONAL ROAD, SUITE 370 |
| ALEXANDRIA, VIRGINIA 22314 |
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