Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11668499
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Filing Dt:
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01/30/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Inventors:
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Yuji Manabe, Takahiro Jingu
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Title:
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APPARATUS AND METHOD FOR WAFER SURFACE DEFECT INSPECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHISHINBASHI, 1-CHOME, |
| MINATO-KU |
| TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS |
| 1300 N. SEVENTEENTH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209 |
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