Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11487340
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Filing Dt:
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07/17/2006
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Publication #:
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Pub Dt:
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09/20/2007
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Inventor:
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Toshio Ogawa
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Title:
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Semiconductor device provided with function for screening test regarding operating speed
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME |
| NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211-8588, JAPAN |
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| ARENT FOX PLLC |
| 1050 CONNECTICUT AVENUE, N.W., SUITE 400 |
| WASHINGTON, D.C. 20036-5339 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO 163-0722, JAPAN |
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| ARENT FOX LLP |
| 1050 CONNECTICUT AVENUE, N.W., SUITE 400 |
| WASHINGTON, D.C. 20036-5339 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 2-10-23 SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
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| FUJITSU PATENT CENTER |
| 2318 MILL ROAD |
| ALEXANDRIA, VA 22314 |
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