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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/31/2009
Application #:
11568873
Filing Dt:
01/12/2007
Publication #:
Pub Dt:
09/27/2007
Inventors:
Masato Haruta, Hiroyuki Konno, Naoya Kimura, Yoshikazu Nakayama
Title:
FIXTURE CHARACTERISTIC MEASURING DEVICE, METHOD, PROGRAM, RECORDING MEDIUM, NETWORK ANALYZER, AND SEMICONDUCTOR TEST DEVICE
Assignment: 1
Reel/Frame:
018753/0514Recorded: 01/12/2007Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/30/2006
Exec Dt:
12/04/2006
Exec Dt:
12/04/2006
Exec Dt:
12/01/2006
Assignee:
32-1 ASAHI-CHO 1-CHOME, NERIMA-KU
TOKYO, JAPAN 179-0071
Correspondent:
GREENBLUM & BERNSTEIN, P.L.C.
1950 ROLAND CLARKE PLACE
RESTON, VA 20191

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