Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11523040
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Filing Dt:
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09/19/2006
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Publication #:
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Pub Dt:
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10/04/2007
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Inventors:
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Masato Uedi, Mamoru Sobue, Kouhei Nagaya, Takeshi Inoue, Yoshinori Gotou
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Title:
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METHOD AND APPARATUS FOR INSPECTING ELEMENT LAYOUT IN SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN |
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| STAAS & HALSEY LLP |
| ATTN: DAVID M. PITCHER |
| 1201 NEW YORK AVENUE, N.W., SUITE 700 |
| WAHSINGTON, D.C. 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO 163-0722, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: H. J. STAAS |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 2-10-23 SHIN-YOKOHAMA |
| KOHOKU-KU, YOKOHAMA-SHI |
| KANAGAWA 222-0033, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: PAUL I. KRAVETZ |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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