Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/03/2009
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Application #:
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10588636
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Filing Dt:
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08/04/2006
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Publication #:
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Pub Dt:
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11/15/2007
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Inventors:
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Kazuyoshi Okawa, Junko Ogino, Masayuki Yoshinaga, Hajime Honda
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Title:
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SEMICONDUCTOR DEVICE TEST APPARATUS AND METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1, ASAHI-CHO, NERIMA-KU |
| TOKYO, JAPAN |
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| DAVID N. LATHROP, ESQUIRE |
| GALLAGHER & LATHROP |
| A PROFESSIONAL CORPORATION |
| 601 CALIFORNIA STREET, SUITE 1111 |
| SAN FRANCISCO, CA 94108-2805 |
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