Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11420960
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Filing Dt:
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05/30/2006
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Publication #:
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Pub Dt:
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12/06/2007
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Inventors:
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Irfan Malik, Somnath Nag
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Title:
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Determining Information about Defects or Binning Defects Detected on a Wafer after an Immersion Lithography Process is Performed on the Wafer
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| DAFFER MCDANIEL, LLP |
| P.O. BOX 684908 |
| AUSTIN, TX 78768-4908 |
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