Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11736350
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Filing Dt:
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04/17/2007
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Publication #:
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Pub Dt:
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12/13/2007
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Inventors:
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Amir Al-Bayati, Babak Adibi, Majeed Foad, Sasson Somekh
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Title:
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METHOD, SYSTEM AND MEDIUM FOR CONTROLLING SEMICONDUCTOR WAFER PROCESSES USING CRITICAL DIMENSION MEASUREMENTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3050 BOWERS AVENUE |
| SANTA CLARA, CALIFORNIA 95054 |
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| PATTERSON & SHERIDAN, LLP |
| 3040 POST OAK BLVD. |
| KEITH M. TACKETT |
| HOUSTON, TX 77056 |
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