Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11833392
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Filing Dt:
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08/03/2007
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Publication #:
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Pub Dt:
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01/10/2008
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Inventors:
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Christophe Vaucher, Pierre Benech
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Title:
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Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 769 BOULEVARD DE L'ESCOURCHE |
| BANDOL, FRANCE F-83150 |
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| JOHN D. SIMMONS [10000-91US] |
| AKIN GUMP STRAUSS HAUER & FELD LLP |
| 2005 MARKET STREET, SUITE 2200 |
| PHILADELPHIA, PA 19103-7013 |
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