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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
11779140
Filing Dt:
07/17/2007
Publication #:
20080017797
Pub Dt:
01/24/2008
Inventors:
Zhaohui CHENG, Hiroshi Makino, Seiko Omori, Kenji Tanimoto
Title:
CONTROL OF SECONDARY ELECTRONS FOR SAMPLE INSPECTION
Assignment: 1
Reel/Frame:
019568/0465Recorded: 07/17/2007Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
CHENG, ZHAOHUI
Exec Dt:
06/27/2007
MAKINO, HIROSHI
Exec Dt:
06/26/2007
TANIMOTO, KENJI
Exec Dt:
06/25/2007
OMORI, SEIKO
Exec Dt:
06/27/2007
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI
1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY,STANGER,MALUR&BRUNDIDGE, P.C.
1800 DIAGONAL ROAD
SUITE 370
ALEXANDRIA, VA 22314
Assignment: 2
Reel/Frame:
019820/0213Recorded: 09/13/2007Pages: 4
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE ADDRESS OF THE ASSIGNEE. PREVIOUSLY RECORDED ON REEL 019568 FRAME 0465. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT TO HITACHI HIGH-TECHNOLOGIES CORPORATION.
Assignors:
CHENG, ZHAOHUI
Exec Dt:
06/27/2007
MAKINO, HIROSHI
Exec Dt:
06/26/2007
TANIMOTO, KENJI
Exec Dt:
06/25/2007
OMORI, SEIKO
Exec Dt:
06/27/2007
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
DANIEL J. STANGER
1800 DIAGONAL ROAD, SUITE 370
ALEXANDRIA, VA 22314

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