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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
07/06/2010
Application #:
11780331
Filing Dt:
07/19/2007
Publication #:
Pub Dt:
01/24/2008
Inventor:
Pedro Vagos
Title:
NON-CONTACT APPARATUS AND METHOD FOR MEASURING A PROPERTY OF A DIELECTRIC LAYER ON A WAFER
Assignment: 1
Reel/Frame:
019577/0931Recorded: 07/19/2007Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/17/2007
Assignee:
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
MICHAEL J. HALBERT
18805 COX AVENUE
SUITE 220
SARATOGA, CA 95070
Assignment: 2
Reel/Frame:
019606/0335Recorded: 07/24/2007Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/17/2007
Assignee:
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
MICHAEL J. HALBERT
18805 COX AVENUE
SUITE 220
SARATOGA, CA 95070
Assignment: 3
Reel/Frame:
052544/0224Recorded: 04/30/2020Pages: 9
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/25/2019
Assignee:
16 JONSPIN ROAD
WILMINGTON, MASSACHUSETTS 01887
Correspondent:
ELENI ZACHARI
184 SHEPHERDS BUSH RD
LONDON, W67NL UNITED KINGDOM

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