Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11631648
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Filing Dt:
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01/05/2007
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Publication #:
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Pub Dt:
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02/21/2008
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Inventors:
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Yukihiro Murakami, Kazuo Asano, Ryuji Okamoto
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Title:
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Stage for Holding Silicon Wafer Substrate and Method for Measuring Temperature of Silicon Wafer Substrate
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SHUWA TORANOMON #2 BLDG. 5F |
1-21-19, TORANOMON, MINATO-KU |
TOKYO 105-0001, JAPAN |
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2-8-11, HIGASHINAKANOBU |
SHINAGAWA-KU, TOKYO 142-0052, JAPAN |
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404-2, KUZEOYABUCHO,MINAMI-KU |
KYOTO-SHI, KYOTO 601-8206, JAPAN |
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JAMES A. OLIFF |
OLIFF & BERRIDGE, PLC |
P.O. BOX 19928 |
ALEXANDRIA, VA 22320 |
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