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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/15/2012
Application #:
11907322
Filing Dt:
10/11/2007
Publication #:
Pub Dt:
02/21/2008
Inventors:
Akihiro Hachigo, Takayuki Nishiura
Title:
DAMAGE EVALUATION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, PRODUCTION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBER AND GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBRANE
Assignment: 1
Reel/Frame:
065817/0967Recorded: 12/07/2023Pages: 6
Conveyance:
NUNC PRO TUNC ASSIGNMENT (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/27/2023
Assignee:
1-1, MARUNOUCHI 1-CHOME, CHIYODA-KU
TOKYO, JAPAN 100-8251
Correspondent:
CPA GLOBAL LIMITED
LIBERATION HOUSE
CASTLE STREET
ST HELIER, JE1 1BL JERSEY

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