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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/14/2010
Application #:
11504388
Filing Dt:
08/15/2006
Publication #:
Pub Dt:
02/21/2008
Inventors:
Chandrasekhar Sarma, Jingyu Lian, Matthias Lipinski, Haoren Zhuang
Title:
METROLOGY SYSTEMS AND METHODS FOR LITHOGRAPHY PROCESSES
Assignment: 1
Reel/Frame:
018257/0029Recorded: 09/15/2006Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/19/2006
Exec Dt:
07/19/2006
Exec Dt:
07/19/2006
Exec Dt:
07/20/2006
Assignee:
1730 NORTH FIRST STREET
SAN JOSE, CALIFORNIA 95112
Correspondent:
HEATHER ROWLAND
3000 CENTREGREEN WAY
CARY, NC 27513
Assignment: 2
Reel/Frame:
018298/0020Recorded: 09/25/2006Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/18/2006
Assignee:
ST.-MARTIN-STR. 53
MUNICH, GERMANY 81669
Correspondent:
HEATHER ROWLAND
3000 CENTREGREEN WAY
CARY, NC 27513

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