Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/28/2010
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Application #:
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11693356
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Filing Dt:
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03/29/2007
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Publication #:
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Pub Dt:
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02/28/2008
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Inventors:
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Ji-Hye Kim, Yu-Sin Yang, Jong-An Kim, Moon-Shik Kang, Ji-Young Shin
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Title:
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WAFER INSPECTING METHOD
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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416, MAETAN-DONG, YEONGTONG-GU |
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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F. CHAU & ASSOC., LLC |
130 WOODBURY ROAD |
FRANK CHAU |
WOODBURY, NY 11797 |
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